✅ Öppen — 51 dagar kvar
Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Tidsplan
Publicerad
2026-07-02
Deadline
2026-08-24
51 dagar kvar
Klassificering
CPV-koder
38511100
38000000
Procedur
open
Rådata (JSON)
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"notice-title": {
"hun": "Svédország – Pásztázó elektronmikroszkópok – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"lav": "Zviedrija – Skenējošie elektronmikroskopi – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"swe": "Sverige – Svepelektronmikroskop – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"gle": "An tSualainn – Scanning electron microscopes – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"ell": "Σουηδία – Ηλεκτρονικά μικροσκόπια σάρωσης – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"spa": "Suecia – Microscopios electrónicos de barrido – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"est": "Rootsi – Skaneerivad elektronmikroskoobid – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"nld": "Zweden – Aftastingselektronenmicroscopen – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"fin": "Ruotsi – Pyyhkäisyelektronimikroskoopit – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"pol": "Szwecja – Skanujące mikroskopy elektronowe – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"hrv": "Švedska – Pretraživački elektronski mikroskopi – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"ces": "Švédsko – Snímací elektronové mikroskopy – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"dan": "Sverige – Elektronrastermikroskoper – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"ron": "Suedia – Microscoape electronice cu scanare – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"por": "Suécia – Microscópios electrónicos de varrimento – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"slk": "Švédsko – Skenovacie elektrónové mikroskopy – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"fra": "Suède – Microscopes électroniques à balayage – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"mlt": "L-Iżvezja – Mikroskopju elettroniku ta' l-iskenjar – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"deu": "Schweden – Rasterelektronenmikroskope – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"lit": "Švedija – Nuskaitantys elektroniniai mikroskopai – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"ita": "Svezia – Microscopi elettronici a scansione – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"bul": "Швeция – Електронни сканиращи микроскопи (с подвижен електронен лъч) – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"slv": "Švedska – Vrstični elektronski mikroskopi – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)",
"eng": "Sweden – Scanning electron microscopes – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)"
},
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}